Standard Test Method for Measuring Steady-State Primary Photocurrent

Importancia y uso:

5.1 PN Junction Diode—The steady-state photocurrent of a simple p-n junction diode is a directly measurable quantity that can be directly related to device response over a wide range of ionizing radiation. For more complex devices the junction photocurrent may not be directly related to device response.

5.2 Zener Diode—In this device, the effect of the photocurrent on the Zener voltage rather than the photocurrent itself is usually most important. The device is most appropriately tested while biased in the Zener region. In testing Zener diodes or precision voltage regulators, extra precaution must be taken to make certain the photocurrent generated in the device during irradiations does not cause the voltage across the device to change during the test.

5.3 Bipolar Transistor—As device geometries dictate that photocurrent from the base-collector junction be much greater than current from the base-emitter junction, measurements are usually made only on the collector-base junction with emitter open; however, sometimes, to obtain data for computer-aided circuit analysis, the emitter-base junction photocurrent is also measured.

5.4 Junction Field-Effect Device—A proper photocurrent measurement requires that the source be shorted (dc) to the drain during measurement of the gate-channel photocurrent. In tetrode-connected devices, the two gate-channel junctions should be monitored separately.

5.5 Insulated Gate Field-Effect Device—In this type of device, the true photocurrent is between the substrate and the channel, source, and drain regions. A current which can generate voltage that will turn on the device may be measured by the technique used here, but it is due to induced conductivity in the gate insulator and thus is not a junction photocurrent.

Subcomité:

E10.07

Volúmen:

12.02

Número ICS:

31.260 (Optoelectronics. Laser equipment)

Palabras clave:

hardness assurance; ionizing radiation; photocurrent; primary photocurrent; semiconductor testing;